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A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low‐frequency optical path‐length drifting and the system is capable of resolving displacements of the order of 10-3 Å. For the strain induced by domain switching, a dual‐channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.