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Correlation between thermal and generation recombination noise sources: Analytical and Monte Carlo approaches

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4 Author(s)
Macucci, M. ; Istituto di Elettronica e Telecomunicazioni, Universita’ di Pisa, Via Diotisalvi 2, 56100 Pisa, Italy ; Pellegrini, B. ; Terreni, P. ; Reggiani, Lino

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The autocorrelation function of current fluctuations caused by thermal scattering and trapping‐detrapping phenomena is analytically evaluated within a simple semiconductor model and a statistical approach. The results, by accounting for the interaction between different sources of noise, are found to generalize existing approximate solutions. Analytical theory is finally compared with an appropriate Monte Carlo simulation obtaining a complete coincidence of the results.

Published in:

Journal of Applied Physics  (Volume:63 ,  Issue: 11 )