Cart (Loading....) | Create Account
Close category search window

Global stability of phase lock near a chaotic crisis in the rf‐biased Josephson junction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Kautz, R.L. ; National Bureau of Standards, Boulder, Colorado 80303

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The global stability of phase lock in the rf‐biased Josephson junction is studied through digital simulations. Global stability is determined by calculating the lifetime of the phase‐locked state in the presence of thermal noise. This lifetime, the mean time required for thermal noise to induce a 2π phase slip, increases exponentially with inverse temperature in the limit of low temperatures, and the low‐temperature asymptote can be parametrized in terms of an activation energy E and an attempt time τ0. The activation energy is a useful measure of global stability for both periodic and chaotic phase‐locked states. The behavior of E and τ0 is studied over a range of critical‐current densities which take the system from a region of harmonic motion through a period‐doubling cascade and into a region of phase‐locked chaotic behavior which is ended by a chaotic crisis. At the crisis point, the activation energy goes to zero and the attempt time goes to infinity. The results are used to determine the optimum critical‐current density for series‐array voltage standards.

Published in:

Journal of Applied Physics  (Volume:62 ,  Issue: 1 )

Date of Publication:

Jul 1987

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.