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Global stability of phase lock near a chaotic crisis in the rf‐biased Josephson junction

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1 Author(s)
Kautz, R.L. ; National Bureau of Standards, Boulder, Colorado 80303

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The global stability of phase lock in the rf‐biased Josephson junction is studied through digital simulations. Global stability is determined by calculating the lifetime of the phase‐locked state in the presence of thermal noise. This lifetime, the mean time required for thermal noise to induce a 2π phase slip, increases exponentially with inverse temperature in the limit of low temperatures, and the low‐temperature asymptote can be parametrized in terms of an activation energy E and an attempt time τ0. The activation energy is a useful measure of global stability for both periodic and chaotic phase‐locked states. The behavior of E and τ0 is studied over a range of critical‐current densities which take the system from a region of harmonic motion through a period‐doubling cascade and into a region of phase‐locked chaotic behavior which is ended by a chaotic crisis. At the crisis point, the activation energy goes to zero and the attempt time goes to infinity. The results are used to determine the optimum critical‐current density for series‐array voltage standards.

Published in:

Journal of Applied Physics  (Volume:62 ,  Issue: 1 )

Date of Publication:

Jul 1987

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