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A copolymer of vinylidene fluoride and tetrafluoroethylene is solution cast on a p‐type silicon wafer. The dipoles in the copolymer are aligned by corona charging the film or by biasing a subsequently evaporated aluminum gate. The field coupling to the semiconductor is studied by measuring the surface channel currents which flow between a metal‐insulator‐semiconductor source and drain. We show that the field coupling following corona injection is sufficient to induce a strong inversion in silicon and that this effect decays with a time constant which can vary between a few minutes to approximately one day.