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Impact of cosmic ray neutron induced soft errors on advanced submicron CMOS circuits

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7 Author(s)
Tosaka, Y. ; Fujitsu Labs. Ltd., Atsugi, Japan ; Satoh, S. ; Suzuki, K. ; Sugii, T.
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We numerically studied the neutron effects on submicron CMOS SRAM and LATCH circuits using a developed simulator which agrees well with the experimental charge collection measurements. We showed that the neutron effects have influence on SEs in advanced integrated circuits, especially for LATCH. If the Pb-Sn solder or other materials with high /spl alpha/-particle emission rates are not included, the neutrons are main SE components in advanced integrated circuits.

Published in:

VLSI Technology, 1996. Digest of Technical Papers. 1996 Symposium on

Date of Conference:

11-13 June 1996