By Topic

The Effect of the Dielectric Layer Thickness on Spectral Performance of CdZnTe Frisch Collar Gamma Ray Spectrometers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Alireza Kargar ; S.M.A.RT. Lab., Kansas State Univ., Manhattan, KS ; Adam C. Brooks ; Mark J. Harrison ; Kyle T. Kohman
more authors

The spectral performance as a function of the dielectric layer thickness for several CdZnTe Frisch collar devices was investigated. Seven different planar bar shaped detectors were fabricated from Redlen Technologies CdZnTe, and many Frisch collar devices were prepared from each planar device. The optimum dielectric layer thickness was experimentally determined for each device. The result of the optimal thickness study was verified through three-dimensional geometry modeling of the potential and electric field. It is shown that there exists an optimal dielectric layer thickness for best performance for CdZnTe Frisch collar devices with aspect ratios (L/W) greater than 2.5.

Published in:

IEEE Transactions on Nuclear Science  (Volume:56 ,  Issue: 3 )