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An open system to interface IEEE-488 measurement devices designed in a microelectronics environment

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4 Author(s)
Perello, C. ; Centro Nacional de Microelectron., Univ. Autonoma de Barcelona, Spain ; Poch, N. ; Schroeter, C. ; Millan, J.

The high production level in microelectronics, leads to the need of using automated data acquisition and data analysis methods. Since often highly specialized measurement devices are used, a method is presented in this report, to build a high-level interface between the user and the measurement devices. This report proposes to use the capabilities of modern computer systems to enable parallel and remote access to measuring devices via a networked host without having to use a dedicated unit to perform this task. An approach is described on the basis of typical PC-compatible computer running the Linux OS and “Open Implementation” software

Published in:

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE  (Volume:1 )

Date of Conference:

1996