Cart (Loading....) | Create Account
Close category search window
 

Localization in Wireless Sensor Networks with Range Measurement Errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kuruoglu, G.S. ; Comput. Eng. Dept., Istanbul Tech. Univ., Istanbul ; Erol, M. ; Oktug, S.

In sensor networks, data collected by sensor nodes needs to be tagged with time and location information. Localization techniques are used to determine the location information by estimating location of a sensor node. It is well known that distance measurement errors affect the accuracy of estimated location. These errors may be due to methodical or environmental factors. In this paper, we propose AML (Adapted Multi-Lateration) by improving the existing multi-lateration technique. It is shown that the AML method is more robust to measurement errors; its mean localization error is lower than the multi-lateration technique for noisy measurements. Besides, the time complexity of the AML method is less than the multi-lateration technique since it does not require to solve the normal equation for the linear least squares problem as in the multi-lateration technique. Additionally, AML is advantageous for iterative localization where localized nodes become reference nodes and employed in the localization process. Incorporating these reference nodes in the AML equations is easier than multi-lateration technique.

Published in:

Telecommunications, 2009. AICT '09. Fifth Advanced International Conference on

Date of Conference:

24-28 May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.