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Mid-infrared transmission enhancement through sub-wavelength metal hole array using impedance-matching dielectric layer

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4 Author(s)
S. C. Lee ; (Center for High Technology Materials and Department of Electrical and Computer Engineering, University of New Mexico, 1313 Goddard SE, Albuquerque, NM 87106, USA) E-mail: sclee@chtm.unm.edu ; E. Plis ; S. Krishna ; S. R. J. Brueck

The mid-infrared transmission through a 3.7 mum period, two-dimensional sub-wavelength Au metallic hole array integrated on a GaSb/InAs strained layer superlattice nBn photodetector is measured. The surface plasmon-polariton excitation on the Au film induces a peak transmission in the 200 K detector response at 4.2 mum. This transmission is enhanced threefold by the insertion of a SiNx layer between the Au film and the substrate for impedance matching analogous to antireflection coating.

Published in:

Electronics Letters  (Volume:45 ,  Issue: 12 )