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This paper contemplate the use of multi probe technology in compact ranges. Multiple positions of a single probe have been used extensively, in particular in the satellite antenna testing community. It allows angular diagrams without moving the test object as well as system level testing. Also recently introduced was the potential of antenna pattern comparison through the measurement of multiple probe positions instead of multiple DUT positions to reduce measurement errors caused by reflector edge diffraction. Obviously an electronically scanned probe array would allow much faster testing directly in the Far Field, and offer APC correction "for free".