By Topic

Electronically scanned arrays as probe and feed system in compact ranges

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Boumans, M. ; ORBIT/FR-Eur. GmbH, Vaterstetten ; Duchesne, L.

This paper contemplate the use of multi probe technology in compact ranges. Multiple positions of a single probe have been used extensively, in particular in the satellite antenna testing community. It allows angular diagrams without moving the test object as well as system level testing. Also recently introduced was the potential of antenna pattern comparison through the measurement of multiple probe positions instead of multiple DUT positions to reduce measurement errors caused by reflector edge diffraction. Obviously an electronically scanned probe array would allow much faster testing directly in the Far Field, and offer APC correction "for free".

Published in:

Antennas and Propagation, 2009. EuCAP 2009. 3rd European Conference on

Date of Conference:

23-27 March 2009