Close category search window
 

Multiphysical Finite Element Modeling of Inductive Type Fault Current Limiters and Self Limiting Transformers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tihanyi, V. ; Dept. of Electr. Power Eng., Budapest Univ. of Technol. & Econ., Budapest, Hungary ; Gyore, A. ; Vajda, I.

A coupled finite element model of inductive type fault current limiter was developed for transient calculations. The model includes two dimensional finite elements for magnetic field directly coupled with network elements and sequentially coupled three dimensional finite elements for thermal calculations. A computer simulation was developed for implementing the model. Both iron and HTS nonlinearity are handled. The HTS model takes the E-J characteristic into account that depends on flux density and its orientation as well as on the temperature. With 3D thermal calculation the model also handles material inhomogeneity along the perimeter. The simulation results were compared with measurements performed on experimental model of a self limiting transformer.

Published in:
Applied Superconductivity, IEEE Transactions on  (Volume:19 ,  Issue: 3 )

Date of Publication: June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.