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Observation of Shapiro-Steps in AFM-Plough Micron-Size YBCO Planar Constrictions

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2 Author(s)
Srinivasu, V.V. ; Stellenbosch Univ., Stellenbosch, South Africa ; Perold, W.J.

Using an atomic force microscope (AFM), we successfully ploughed micron size planar constriction type junctions on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an inverted cylindrical magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. We were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson effect in these constrictions.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:19 ,  Issue: 3 )

Date of Publication:

June 2009

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