Cart (Loading....) | Create Account
Close category search window
 

Optimization of NDE Characterization Parameters for a RF-SQUID Based System Using FEM Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Fardmanesh, M. ; Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran ; Sarreshtedari, F. ; Pourhashemi, A. ; Ansari, E.
more authors

We have investigated the dependence of the optimal non destructive evaluation (NDE) characterization on different excitation parameters in an eddy current SQUID NDE system for samples with known flaw depths. The considered parameters in our study include the configuration of the excitation-coil and its current frequency. The system is based on a high-TC YBCO gradiometer RF-SQUID sensor with a flux noise level below 100 muPhi0/radicHz at 100 Hz in an unshielded environment, while being shielded against external RF EMI (electromagnetic interference). According to experimental results and the associated numerical analysis using finite element (FEM) simulations, we have derived the optimized parameters for the maximum sensitivity of the system. The optimized parameters are found using a new model for excitation coil and eddy current anomalies caused by the flaws. Very good agreement between experimental and numerical approaches confirmed our model and the resultant implemented optimization method.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:19 ,  Issue: 3 )

Date of Publication:

June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.