By Topic

Effects of classical and quantum charge fluctuations on sequential electron tunneling in multiple quantum wells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Huang, Danhong ; Air Force Research Laboratory (AFRL/VSSS), Kirtland Air Force Base, New Mexico 87117 ; Cardimona, D.A.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1594815 

A previous theory [M. Ershov etal, Appl. Phys. Lett. 67, 3147 (1995)] for studying the distribution of nonuniform fields in multiple-quantum-well photodetectors under an ac voltage is generalized to include nonadiabatic space-charge-field effects. From numerical results calculated by the generalized theory, it is found that field-domain effects are only important at high temperatures or high voltages, where both injection and sequential-tunneling currents are expected to be large. On the other hand, field-domain effects become negligible at low temperatures and low voltages, but nonadiabatic effects included in this extended theory are enhanced for small sequential-tunneling currents. The time duration for nonadiabatic effects is determined by the quantum capacitance. By using the generalized theory, a differential capacitance is calculated for a non-steady state, and a negative conduction current is predicted under a positive voltage in this case due to charge accumulation around the collecting contact.

Published in:

Journal of Applied Physics  (Volume:94 ,  Issue: 6 )