Cart (Loading....) | Create Account
Close category search window

Raman scattering of germanium nanocrystals embedded in glass matrix under hydrostatic pressure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Liu, L. ; Department of Physics, Blk. S12, Faculty of Science, National University of Singapore, 2 Science Drive 3, Singapore 117542, Singapore ; Shen, Z.X. ; Teo, K.L. ; Kolobov, A.V.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We have studied the hydrostatic pressure dependence of Ge nanocrystals embedded into SiO2 matrix on quartz-glass substrate by Raman scattering at room temperature. The pressure coefficient (dω/dP=0.77 cm-1kbar-1) obtained for the Ge–Ge mode in the nanocrystals is found to be almost twice as large compared with its corresponding bulk value (dω/dP=0.39 cm-1kbar-1). We explained our results using a simple elastic model, which describes the effective pressure transmitted from the matrix to the nanocrystals. © 2003 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:93 ,  Issue: 11 )

Date of Publication:

Jun 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.