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Effect of high magnetic fields on the morphology of soft magnetic α-FeN films

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4 Author(s)
Wang, H.Y. ; Department of Physics, Tsinghua University, Beijing 100084, People’s Republic of China ; Mitani, S. ; Motokawa, M. ; Fujimori, H.

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The effect of high magnetic field on the microstructure and magnetic properties of α-FeN films has been studied. The application of a high magnetic field during sputter deposition has a significant influence on the microstructure of α-FeN films. In particular, the grain growth and the surface roughness are suppressed, and concurrently the coercivity becomes much lower. α-FeN films deposited in magnetic fields of 2 and 4 T exhibit smooth surfaces with root-mean-square (rms) roughness of, respectively, 0.38–1.53 nm, saturation magnetization of 2.25–2.32 T and coercivity of 1.6–2.6 kA/m, while α-FeN films deposited at H=0 T show rough surfaces with rms roughness of 6.0–6.8 nm, saturation magnetization of 2.13–2.15 T and coercivity of 9.8–12 kA/m. This effect of high magnetic field on the surface morphology is expected to be widely used to improve various properties of thin films. © 2003 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:93 ,  Issue: 11 )

Date of Publication: Jun 2003

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