Cart (Loading....) | Create Account
Close category search window
 

Free-Space Imaging Beyond the Diffraction Limit Using a Veselago-Pendry Transmission-Line Metamaterial Superlens

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Iyer, A.K. ; Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON ; Eleftheriades, G.V.

Focusing using conventional lenses relies on the collection and interference of propagating waves, but discounts the evanescent waves that decay rapidly from the source. Since these evanescent waves contain the finest spatial details of the source, the image suffers a loss of resolution and is referred to as ldquodiffraction-limited.rdquo Superlensing is the ability to create an image with fine features beyond the diffraction limit, and can be achieved with a ldquoVeselago-Pendryrdquo lens made from a metamaterial. Such a Veselago-Pendry superlens for imaging in free space must be stringently designed to restore both propagating and evanescent waves, but meeting these design conditions (isotropic n = epsivr = mur = -1) has proven difficult and has made its realization elusive. We demonstrate free-space imaging with a resolution over three times better than the diffraction limit at microwave frequencies using a Veselago-Pendry metamaterial superlens based on the negative-refractive-index transmission-line (NRI-TL) approach, which affords precise control over its properties and is also less susceptible to losses than other approaches. A microwave superlens can be particularly useful for illumination and discrimination of closely spaced buried objects over practical distances by way of back-scattering, e.g., in tumour or landmine detection, or for targeted irradiation over electrically small regions in tomography/hyperthermia applications.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:57 ,  Issue: 6 )

Date of Publication:

June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.