Cart (Loading....) | Create Account
Close category search window
 

Performance computation for precharacterized CMOS gates with RC loads

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Dartu, F. ; Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA ; Menezes, N. ; Pileggi, L.T.

For efficiency, the performance of digital CMOS gates is often expressed in terms of empirical models. Both delay and short-circuit power dissipation are sometimes characterized as a function of load capacitance and input signal transition time. However, gate loads can no longer be modeled by purely capacitive loads for high performance CMOS due to the RC metal interconnect effects. This paper presents a methodology for interfacing empirical gate models to reduced order RC interconnect models in terms of a nonlinear iteration procedure. The delay and power are calculated with errors on the same order as those for the original empirical equations. Moreover, a linear equivalent gate model is generated which accurately captures the delays at the interconnect fan-out nodes

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:15 ,  Issue: 5 )

Date of Publication:

May 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.