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Influence of Cr concentration on recording characteristics of Co-Cr media

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3 Author(s)
A. Werner ; BASF AG, Ludwigshafen, West Germany ; H. Hibst ; H. Mannsperger

Investigating the optimum Cr concentration for single-layer Co100-xCrx media with high storage capabilities, the authors have prepared 300-nm-thick layers with x=11-34 at.% Cr by coevaporation on polyimide substrates. The values of M s, Δθ, Hk, and H c (perpen) change slowly and continuously with the Cr concentration x. The degree of the perpendicular crystallographic and magnetic orientation increases with Cr content. Recording tests with VHS-type video heads on 3.5-in. flexible disks, protected by a 40-nm-thick sputtered a-C layer, give clear evidence of a change of the recording mode at ~22 at.% Cr. Only for higher x is the preferred perpendicular recording signal obtained. Due to the use of ring heads, the D50 values show a strong correlation with Hk, whereas no obvious correlation with Δθ and Hc (perpen) is found. For Cr concentrations >25 at.%, D50 values of more than 90 kfci are obtained

Published in:

IEEE Transactions on Magnetics  (Volume:26 ,  Issue: 1 )