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An iDD transient analysis technique for defect detection in digital integrated circuits

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3 Author(s)
Beasley, J. ; Dept. of Eng. Technol., New Mexico State Univ., Las Cruces, NM, USA ; Ramirez-Angulo, J. ; Steiner, R.

This paper presents a unique method for detecting defects in digital integrated circuits by analyzing the changes observed in the transient power supply currents for the device under test. The transient currents are generated by simultaneously pulsing the VDD and VSS power supply rails using a technique called iDD Pulse Response Testing

Published in:

Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on  (Volume:1 )

Date of Conference:

13-16 Aug 1995