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Repetitive and single shot pulse microwave six-port reflectometer

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3 Author(s)
Y. Demers ; Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada ; R. G. Bosisio ; F. M. Ghannouchi

The six-port reflectometer technique is extended to make pulsed-RF measurements. It is shown that a time resolution on the order of 1 μs is possible in both repetitive and single-shot mode of operation of the reflectometer. A proof of the principle of the method is carried out using passive and active loads. A simple method for the linearization of diode-detector response is presented. Because of its good time resolution, this method can be used to study thermal and burn-out effects in high-power solid-state amplifiers, or to characterize, for example, pulse devices used in phased-array radars. Its ability to operate in single-shot mode is in contrast to existing reflectometers. It is easily extendable to the millimeter-wave frequency range and can be used to make multiport measurements

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:39 ,  Issue: 1 )