Repetitive and single shot pulse microwave six-port reflectometer

The six-port reflectometer technique is extended to make pulsed-RF measurements. It is shown that a time resolution on the order of 1 mu s is possible in both repetitive and single-shot mode of operation of the reflectometer. A proof of the principle of the method is carried out using passive and active loads. A simple method for the linearization of diode-detector response is presented. Because of its good time resolution, this method can be used to study thermal and burn-out effects in high-power solid-state amplifiers, or to characterize, for example, pulse devices used in phased-array radars. Its ability to operate in single-shot mode is in contrast to existing reflectometers. It is easily extendable to the millimeter-wave frequency range and can be used to make multiport measurements.<
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