Cart (Loading....) | Create Account
Close category search window

Spectroscopic ellipsometric study on dispersion of optical constants of Gd2O3 films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bhattacharyya, D. ; Spectroscopy Division, Bhabha Atomic Research Centre, Mumbai 400 085, India ; Biswas, A.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Electron-beam evaporated Gd2O3 films have been characterized by spectroscopic ellipsometry technique. The experimental ellipsometric data have been fitted with theoretical models to derive information on the sample structure and dispersion of the optical constants of bulk Gd2O3. Three different dispersion models, proposed so far for amorphous materials have been used for the calculation of the refractive-index dispersion and results obtained from these models have been compared.

Published in:

Journal of Applied Physics  (Volume:97 ,  Issue: 5 )

Date of Publication:

Mar 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.