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In our previous studies, we indicated that the coercivity of patterned magneto-optical thin film is quite different from nonpatterned samples. However, we only compared the hysteresis loop bulk measurements of the samples. In this study, we measured the microhysteresis curves at an arbitrary position while coercivity distribution was mapped, and observed submicron images of the remnant state of domain reversal patterns. The spatial variations of the coercivity over several depths of hole arrays barrier on patterned film will be reported.