By Topic

Electric, thermal, and magnetic properties of CeSix with 1.57≪x≤2.0

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Smith, Jesse S. ; Department of Physics, Temple University, Philadelphia, Pennsylvania 19122 ; Zan, J.A. ; Lin, C.L. ; Li, Jing

Your organization might have access to this article on the publisher's site. To check, click on this link: 

It has been shown that CeSix exhibits a variety of interesting physical properties, however the magnetic ground state was unclear due to the possible coexistence of multiple magnetic phases. In this study, the physical properties of CeSix with 1.57≪x≤2.0 have been investigated to clarify the magnetic ordering ground states throughout the series. For Si concentrations greater than 1.80, samples are paramagnetic. Ferromagnetic ordering first appears when Si concentration is decreased to 1.80. For Si concentrations ranging from 1.73 to 1.80, TC=13.8 K. As Si concentration is further decreased below 1.73, TC steps down to 12 K, remaining constant down to the lowest concentration studied, x=1.57. Interestingly, the latter change in magnetic ground state is accompanied by a structural distortion from the ThSi2-type tetragonal structure to the GdSi2-type orthorhombic phase. In the magnetic regime, zero-field-cooled and field-cooled magnetization data are irreversible, indicating a strong domain-wall pinning effect. Values of TC are corroborated by specific-heat and resistivity measurements.

Published in:

Journal of Applied Physics  (Volume:97 ,  Issue: 10 )