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A static photometric ellipsometer allows the measurement of the magneto-optic Kerr effect at a very high signal-to-noise ratio. To gain information about the state of magnetization a mathematical description of the optical components is required. This involves the use of trigonometric functions, e.g., within the Müller calculus. As these are transcendental functions the inversion of the formulae defining the final state of polarization is impossible. The commonly applied linearization is only valid for thin samples with small Kerr angles. For large Kerr angles the nonlinearity of the analyzer setup becomes important. The influence of these nonlinearities on static ellipsometry is studied analytically and numerically. A method is developed to reveal the magnetic properties with high accuracy despite of the nonlinearities due to the optical setup. The applicability of the method is demonstrated for the experimental data obtained from an ion-irradiated iron film on silicon, revealing the magnetic behavior of the investigated sample. The encountered effects are of fundamental importance for the full vectorial magnetization analysis when large Kerr signals are obtained in experiments.