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Scattering rings as a tool for birefringence measurements in porous silicon

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8 Author(s)
Oton, C.J. ; INFM and Department of Physics, University of Trento, Via Sommarive 14, 38050 Povo (TN), Italy ; Ghulinyan, M. ; Gaburro, Z. ; Bettotti, P.
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We report measurements of angle-resolved light scattering in porous silicon films. Scattering rings were observed, and their aperture allowed to measure optical birefringence. These values are confirmed with other techniques. We study birefringence changes when pores are filled with liquids, after thermal annealing, and when the porous silicon layer is chemically etched in HF for different times. A decrease of optical anisotropy was observed in all cases. © 2003 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:94 ,  Issue: 10 )