Cart (Loading....) | Create Account
Close category search window

High-accuracy determination of the dependence of the photoluminescence emission energy on alloy composition in AlxGa1-xAs films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Robins, Lawrence H. ; National Institute of Standards and Technology, Gaithersburg, Maryland 20899 ; Armstrong, John T. ; Marinenko, Ryna B. ; Paul, Albert J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

In an effort to improve the accuracy of photoluminescence (PL) measurements of the Al mole fraction (x) of AlxGa1-xAs alloys, the PL peak emission energy, EPL,peak, was measured at room temperature for molecular-beam epitaxy-grown AlxGa1-xAs films with 0≤x≪0.37, and correlated with independent measurements of x by in situ reflective high-energy electron diffraction (RHEED) and also by ex situ wavelength-dispersive x-ray spectroscopy in an electron microprobe analyzer (WDS/EMPA). The measurement uncertainty of EPL,peak was minimized through the following procedures: Accurate calibration of the photon energy (or wavelength) scale, correction of the measured spectra for the spectrometer response function, fitting the data with a well-chosen line shape function, and compensation for the effect of ambient temperature drift. With these procedures, the 2σ measurement uncertainty of EPL,peak was of the order 5×10-4eV for most samples. From correlation of the PL and WDS/EMPA composition data, the slope EPL,peak/∂x near room temperature was determined to be EPL,peak/∂x=(1.4017±0.0090 eV)-[(2.71±0.97)×10-4eV/K](T-298.3 K). Correlation with the RHEED data gave the same result within measurement uncertainty. Previously published measurements of- EPL,peak/∂x were reviewed and compared with the present study. The results of T. F. Kuech etal [Appl. Phys. Lett. 51, 505 (1987)], based on nuclear resonant reaction analysis of the Al mole fraction, were found to be in good agreement with the present study after the addition of a correction term to account for the sample temperature difference (T=2 K for Kuech etal, T=298 K for the present study).

Published in:

Journal of Applied Physics  (Volume:93 ,  Issue: 7 )

Date of Publication:

Apr 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.