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Evolution of normal stress and surface roughness in buckled thin films

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2 Author(s)
Palasantzas, G. ; Department of Applied Physics, Materials Science Center and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands ; de Hosson, J.Th.M.

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In this work we investigate buckling of compressed elastic thin films, which are bonded onto a viscous layer of finite thickness. It is found that the normal stress exerted by the viscous layer on the elastic film evolves with time showing a minimum at early buckling stages, while it increases at later stages. The normal stress also shows a minimum as a function of applied compressive stress, which depends strongly on the viscosity of the underlying layer and strain values. Furthermore, with decreasing viscosity the film roughness amplitude also shows a minimum at early buckling stages. The effect of the viscosity becomes more pronounced with increasing strain in the film. Finally, decreasing elastic film thickness and/or increasing viscous layer thickness also enhance buckling roughness. © 2003 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:93 ,  Issue: 2 )

Date of Publication:

Jan 2003

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