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Imaging subwavelength holes using an apertureless near-field scanning optical microscope

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3 Author(s)
Formanek, F. ; Laboratoire d’Optique Physique, CNRS UPR A0005, École Supérieure de Physique et de Chimie Industrielles, 10 rue Vauquelin, 75005 Paris, France ; De Wilde, Y. ; Aigouy, L.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1574178 

We present investigations of the light scattered by subwavelength holes in a chromium film using an apertureless near-field scanning optical microscope, which operates either in the visible (λ=655 nm) or in the infrared (λ=10.6 μm). The near-field optical images exhibit patterns around the holes that seem to coincide with the component of the stray electrical field parallel to the tip axis. A tip–sample dipole coupling model provides a satisfactory description of the experimental data recorded in the infrared with light polarized normally to the sample surface. © 2003 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:93 ,  Issue: 12 )