Close category search window
 

Investigating learning rates for evolution and temporal difference learning

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Lucas, S.M. ; Dept. of Comput. & Electron. Syst., Univ. of Essex, Colchester

Evidently, any learning algorithm can only learn on the basis of the information given to it. This paper presents a first attempt to place an upper bound on the information rates attainable with standard co-evolution and with TDL. The upper bound for TDL is shown to be much higher than for co-evolution. Under commonly used settings for learning to play Othello for example, TDL may have an upper bound that is hundreds or even thousands of times higher than that of coevolution. To test how well these bounds correlate with actual learning rates, a simple two-player game called Treasure Hunt is developed. While the upper bounds cannot be used to predict the number of games required to learn the optimal policy, they do correctly predict the rank order of the number of games required by each algorithm.

Published in:
Computational Intelligence and Games, 2008. CIG '08. IEEE Symposium On

Date of Conference: 15-18 Dec. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.