Close category search window
 

Current-induced switching in low resistance magnetic tunnel junctions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Liu, Yaowen ; INESC Microsystems and Nanotechnologies, R. Alves Redol 9, 1000 Lisbon, Portugal ; Zhang, Zongzhi ; Wang, Jianguo ; Freitas, P.P.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1543868 

Current-induced magnetization switching (CIMS) in low resistance tunnel junctions is reported at critical current densities of 1.9×106A/cm2 for tunnel junction areas ranging from 2 to 3 μm2, and junction resistances from 6 to 20 Ω μm2. Typical tunnel magnetic resistance values for these junctions range from 15% to 21% (measured in an external magnetic field) and 10% to 14% resistance changes are obtained by CIMS. Micromagnetic simulation indicates that vortex fields and spin transfer effects cannot fully account for the observed current-induced switching. Although able to explain the observed transition from a parallel or antiparallel state to a vortex state, it fails to explain the switch back to the original state, at a comparable but symmetrical critical current density. © 2003 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:93 ,  Issue: 10 )

Date of Publication: May 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.