Cart (Loading....) | Create Account
Close category search window

Nonuniform demagnetizing field and magnetization in element of patterned NiFe films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Zhai, Y. ; Department of Physics, Southeast University, Nanjing 210096, People’s Republic of ChinaNational Laboratory of Solid Microstructures, Nanjing University, Nangjing 210093, People’s Republic of China ; Li, J. ; Yan, Y. ; Zhang, X.Y.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Patterned arrays of micron and submicron rectangular Ni81Fe19 elements studied by ferromagnetic resonance (FMR) previously showed that an in-plane shape anisotropy existed in the element, with two origins. One is contributed from a quasiuniform magnetization described by conventional demagnetizing factors, another is an effect of the non-uniform magnetization in the nonellipsoidal element. The results of micromagnetic numerical calculation provide further evidence of the nonuniform demagnetizing field and nonuniform magnetization in the rectangular elements. The calculated profile of demagnetizing field shows that as the aspect ratio increases the non-uniform demagnetizing field decreases, as the data of in-plane FMR require. When the static field is not along either of the edges the demagnetizing field become more nonuniform. Not only its magnitude but also its direction is nonuniform, which causes nonuniform static and microwave field and thus meets the condition for magnetostatic mode excitation as observed by FMR. When the field is along the film normal, the demagnetizing fields at the film edges differ much from the uniform field in the central portion and the magnetization changes gradually across the side. These meet the requirement of dynamic pinning and the excitation of the spin waves with k vector along the narrow side of the elements that was observed by FMR. © 2003 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:93 ,  Issue: 10 )

Date of Publication:

May 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.