By Topic

Conducted noise suppression effect up to 3 GHz by NiZn ferrite film plated at 90 °C directly onto printed circuit board

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
7 Author(s)
Kondo, K. ; NEC Tokin Corporation, 6-7-1, Koriyama, Taihaku-ku, Sendai, Miyagi 982-8510, Japan ; Chiba, T. ; Ono, H. ; Yoshida, S.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1555362 

A NiZn ferrite film (3 μm thick) was deposited at 90 °C by the spin-spray ferrite plating from an aqueous solution onto a 50 Ω microstrip line formed on an epoxy printed circuit board (PCB). A strong magnetic loss was caused by the ferrite film in a GHz range, ΔPloss reaching 67% attenuation at 3 GHz, the upper limit of our measurement. Furthermore, the reflection loss was very weak, S11 being smaller than 7%. Thus plated NiZn ferrite films hold strong promise to be actually applied to a type of thin film electromagnetic noise suppressors; the films can be directly deposited onto noise sources (semiconductor elements or electronic circuits) to attenuate conducted-electromagnetic noises in the GHz range. Because the plated NiZn ferrite film was magnetically isotropic in film plane, the noise suppressors will be isotropic, attenuating noise electromagnetic waves radiated from any directions. The NiZn ferrite film was also plated on a flat glass substrate as a standard, which exhibited natural resonance frequency of fr=500 MHz and initial real permeability of μ=50. Compared to these values, the film on the PCB had higher fr of 850 MHz, though reduced in μ to 40. But the spectrum of the imaginary permeability μ shifted to a higher frequency range. This facilitated the strong magnetic loss at the high frequencies. The higher fr for the film on the PCB may be attributed to the undulated columnar structure of the film which was observed by scanning electron microscopy. © 2003 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:93 ,  Issue: 10 )