Close category search window
 

Comment on “Conduction and low frequency channel noise of GaAs based pseudomorphic high electron mobility transistors” [J. Appl. Phys. 91, 3318 (2002)]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Py, M.A. ; Institut de Photonique et d’Electronique Quantiques, Faculté des Sciences de Base, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Suisse ; Buehlmann, H.‐J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1505688 

In order to analyze the low-frequency noise of GaAs based pseudomorphic high electron mobility transistors, Valenza etal [J. Appl. Phys. 91, 3318 (2002)] proposes a model of the conduction at low drain bias with a procedure to extract the few relevant parameters. However, the original derivation of this analytical model and the parameter extraction procedure were published in 1991, 1994, and in connection with a detailed 1/f noise analysis in 1996. This fact is not clearly recognized in the aforementioned article, due in particular to a misquotation of the first equation. Apart from clarifying this point, we give a comment on the noise results. © 2002 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:92 ,  Issue: 8 )

Date of Publication: Oct 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.