By Topic

Triode-type field emission array using carbon nanotubes and a conducting polymer composite prepared by electrochemical polymerization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

15 Author(s)
Jin, Y.W. ; Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, Kyunggi-do 440-600, KoreaDepartment of Materials Engineering, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Korea ; Jung, J.E. ; Park, Y.J. ; Choi, J.H.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1489067 

We report a method to fabricate carbon nanotubes (CNT)/conducting polymer composite films for the application of CNTs to field emission displays. The composite was prepared by a combination of electrochemical polymerization of pyrrole and electrophoretic deposition of CNTs. We obtained a uniform CNT/conducting polypyrrole polymer composite film. The CNTs were mainly coated on protrusions of the polypyrrole film and emitted electrons without rubbing and stretching. We realized a triode-type field emission array (FEA) using the CNT/polypyrrol composite. This FEA showed that the emission current was modulated by gate voltage of 30 V. The film morphology and emission characteristics of the CNT/conducting polymer composite were studied using optical microscopy, scanning electron microscopy, and an emission test in vacuum. © 2002 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:92 ,  Issue: 2 )