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Dielectric measurements of water and methanol containing gold, graphite, silicon, silicon carbide, and silicon nitride powders were performed using the time domain reflectometry method. The relaxation process caused by orientation of the polar liquid molecules was observed in the frequency range of 100 MHz to 20 GHz, similar to the pure liquid. The relaxation strength shows an abnormal increase with volume fraction growth of the conductor or semiconductor, and it diverged at a certain fraction. The dependence on the concentration of
Published in:
Journal of Applied Physics
(Volume:91
,
Issue:
7
)
Date of Publication: Apr 2002