Close category search window
 

A Low-Cost VLSI Implementation for Efficient Removal of Impulse Noise

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Pei-Yin Chen ; Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Chih-Yuan Lien ; Hsu-Ming Chuang

Image and video signals might be corrupted by impulse noise in the process of signal acquisition and transmission. In this paper, an efficient VLSI implementation for removing impulse noise is presented. Our extensive experimental results show that the proposed technique preserves the edge features and obtains excellent performances in terms of quantitative evaluation and visual quality. The design requires only low computational complexity and two line memory buffers. Its hardware cost is quite low. Compared with previous VLSI implementations, our design achieves better image quality with less hardware cost. Synthesis results show that the proposed design yields a processing rate of about 167 M samples/second by using TSMC 0.18 ??m technology.

Published in:
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:18 ,  Issue: 3 )

Date of Publication: March 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.