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Low-temperature scanning near-field optical microscope for rapid measurement of thousands of absorption spectra

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3 Author(s)
Fukutake, Naoki ; Department of Physics, Faculty of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-0033, Japan ; Takasaka, S. ; Kobayashi, Takayosi

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The design and performance of a developed scanning near-field optical microscope suited to the rapid measurement of absorption spectra at many pixels to obtain absorption images at low temperatures are described. An optical system composed of a tungsten–halogen lamp and a charge-coupled device camera as a broadband white light source and a multichannel detector, respectively, is employed to reduce acquisition time for a single-pixel spectrum down to 100 ms. Moreover, this microscope can be operated in both illumination and collection modes. The latter mode can provide polarization dependence of absorption spectra. The experiments with molecular J aggregates dispersed in a thin polymer film demonstrate the capability of this instrument to measure near-field absorption spectra at 50×50 scanned positions within 5 min and to obtain absorption images at different wavelengths. They offer useful information about the spatial distributions of the absorbing materials on the sample surface. © 2002 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:91 ,  Issue: 2 )