Close category search window
 

Direct measurement of electron density and temperature distributions in a micro-discharge plasma for a plasma display panel

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Noguchi, Yasuyuki ; Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan ; Matsuoka, Akira ; Uchino, Kiichiro ; Muraoka, Katsunori

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1419264 

Spatial distributions of electron density (ne) and electron temperature (Te) of a micro-discharge plasma for an alternating current plasma display panel cell were directly measured using the laser Thomson scattering method. The use of a triple-grating spectrometer was very successful in suppressing the strong stray laser light and allowed us to perform measurements at 0.1 mm above the surface of the electrode substrate. Values of ne and Te were (0.2–3)×1019 m-3 and (1.6–3.4) eV, respectively, depending on the time from the beginning of the pulsed discharge and the observation position. The structure of the micro-discharge is discussed in terms of the obtained distributions of ne and Te. © 2002 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:91 ,  Issue: 2 )

Date of Publication: Jan 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.