By Topic

Effect of thermal fluctuations on switching field of deep submicron sized soft magnetic thin film

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
Lee, K.J. ; Storage Laboratory, Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, Korea ; Lee, T.D.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1454977 

In this article, the effect of thermal fluctuations on switching field at short and long time scales have been investigated by micromagnetic simulation with the Langevin and the time-temperature scaling methods. When the film thickness and/or the aspect ratio are reduced, the switching field decreases substantially owing to the decrease of shape anisotropy and the increase of thermal fluctuation. In the soft magnetic film with a dimension of 0.4 μm×0.2 μm×1 nm, the calculated switching field at a pulse width of 10 ns is 32 Oe, but estimated retention time is less than 1000 s. In such a thermally unstable film, thermally activated switching of magnetization occurs by complex behaviors with creations and annihilations of small and slightly tilted magnetic clusters. © 2002 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:91 ,  Issue: 10 )