Close category search window
 

Synthetic ferrimagnet free layer tunnel junction for magnetic random access memories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sousa, R.C. ; INESC, R. Alves Redol, 9 - 1Dto, 1000-029 Lisbon, PortugalIST, Physics Department, Av. Rovisco Pais, 1096 Lisbon, Portugal ; Zhang, Zhongzhi ; Freitas, P.P.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1447530 

In this work a synthetic ferrimagnet structure as a spin dependent tunnel junction free layer is proposed as a magnetic random access memories cell. The CoFe/Ru/CoFe and CoFe/NiFe/Ru/NiFe/CoFe systems show antiferromagnetically coupling range ≫1000 Oe and rotate rigidly anti-aligned with coercive fields below 30–40 Oe. Tunnel junctions were patterned to 4 μm×2 μm rectangles and ellipses using standard CoFe/Ni and synthetic ferrimagnet free layers. Identical signal levels are measured (17.8% and 16.3% as-deposited). Switching fields are dominated by material anisotropy for the synthetic ferrimagnet structure. Both free layer types show reversal by domain wall motion. Less switching dispersion is found for synthetic ferrimagnet free layer (≈10 Oe), with magnetization reversal occurring mostly in sharp single steps. © 2002 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:91 ,  Issue: 10 )

Date of Publication: May 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.