Close category search window
 

High magnetic field measurements on the layered III–VI diluted magnetic semiconductor Ga1-xMnxS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Pekarek, T.M. ; Department of Chemistry and Physics, University of North Florida, Jacksonville, Florida 32224 ; Maymi, C. ; Garner, J. ; Hall, D.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1452644 

Magnetic measurements on Ga1-xMnxS in fields up to 25 T have been made at the National High Magnetic Field Laboratory using the cantilever technique. Ga1-xMnxS is in the new class of III–VI diluted magnetic semiconductors that are nominally two-dimensional (similar to mica). At temperatures below 30 K and in fields above 15 T the magnetization deviates from the previously reported linear behavior in lower field measurement. The diamagnetic constant for the host GaS has been measured to be M/H=-3.7×10-7emu/gG. The magnetization of Ga1-xMnxS exhibits a small anisotropy with the easy axis along the c axis. Theoretical calculations for noninteracting moments were made and show reasonable agreement with the experimental data above 40 K. © 2002 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:91 ,  Issue: 10 )

Date of Publication: May 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.