Cart (Loading....) | Create Account
Close category search window

Temperature dependence of 1/f noise in Pd/n-GaAs Schottky barrier diode

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Singh, R. ; Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110067, India ; Kanjilal, D.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Temperature dependence of 1/f noise in the Pd/n-GaAs Schottky barrier diode has been investigated. The noise measurements were performed under forward bias over a wide temperature range from 90 to 300 K and frequency range from 1 to 100 Hz. The noise spectra exhibited a frequency dependence proportional with 1/f′γ where γ varied between 0.8 and 1.2. It was observed that the spectral power density of current noise SI decreased with the increase in temperature up to 130 K. This behavior has been attributed to the spatial inhomogeneities of the Schottky barrier height at the metal–semiconductor interface. Above a temperature of 130 K, SI increased with the increase in temperature. This variation in SI has been attributed to the mobility and diffusivity fluctuations of the carriers within the space charge region of the Schottky barrier diode. © 2002 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:91 ,  Issue: 1 )

Date of Publication:

Jan 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.