By Topic

Switchable yttrium–hydride mirrors grown on CaF2(111): A x-ray photoelectron spectroscopy and diffraction study

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hayoz, J. ; Institut de Physique, Université de Fribourg, Pérolles, CH-1700 Fribourg, Switzerland ; Schoenes, J. ; Schlapbach, L. ; Aebi, P.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The epitaxial growth of Y (hydride) films on CaF2(111) has been investigated using x-ray photoelectron spectroscopy, x-ray photoelectron diffraction, and low energy electron diffraction (LEED). For Y deposition at 700 °C the formation of high-quality epitaxial hcp(0001) oriented Y films is observed. Whenever the Y films showed good surface quality, the surface is rich in F. Only when the deposition temperature was chosen so low that the LEED reflexes were very broad was no fluorine detected. This is a strong indication that F acts as a surfactant. For Y deposition at room temperature under a H2 partial pressure of 5×10-6 mbar we observe the formation of a F-free, transparent YH2.3 film of a red/yellow color and poor crystallinity. Hydrogen unloading is accomplished by annealing to 600 °C. The film loses its transparency, the poorly ordered fcc(111) lattice converts to a well-ordered hcp(0001) lattice, and F contamination is restored. © 2001 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:90 ,  Issue: 8 )