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1/f noise of Bi2Sr2CaCu2Oy intrinsic Josephson junctions

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4 Author(s)
Saito, A. ; Department of Electrical Engineering, Nagaoka University of Technology, 1-1603 Kamitomioka, Nagaoka, 940-2188, Japan ; Hamasaki, K. ; Irie, A. ; Oya, G.

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We have measured the low-frequency voltage noise properties across mesa stacks of intrinsic Josephson junctions in Bi2Sr2CaCu2Oy (BSCCO) single crystals as a function of bias voltage. The BSCCO mesas with area of 160×40 μm2 were fabricated on the surface of cleaved BSCCO single crystals using standard photolithography and Ar ion-milling techniques. The measured noise voltage spectrum density SV(f ) had a 1/f dependence on frequency. The magnitude of the 1/f noise spectra was found to increase monotonically with the branch number in the I–V characteristic at fixed bias current, and no anomalously enhanced 1/f noise was observed. © 2001 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:90 ,  Issue: 6 )

Date of Publication:

Sep 2001

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