Cart (Loading....) | Create Account
Close category search window
 

Epitaxy of Pd thin films on (100) SrTiO3: A three-step growth process

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wagner, T. ; Max-Planck-Institut für Metallforschung, D-70174 Stuttgart, Germany ; Richter, G. ; Ruhle, M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1338987 

Control of the orientation of thin Pd films on (100) SrTiO3 surfaces was obtained by changing the growth temperature. In particular, a three-step growth method was applied to deposit thin single-crystal Pd films on single-crystal (100) SrTiO3 surfaces. This was realized by first growing epitaxial Pd seeds at elevated temperatures. Subsequently, the seeds were overgrown at room temperature by polycrystalline Pd which fully covered the substrate at a low thickness. Annealing of these films promoted growth of the epitaxial seeds, resulting in single-crystal Pd films: (100) SrTiO3||(100) Pd, [010] SrTiO3||[010] Pd. The three-step growth method turned out to be a useful method to overcome surface roughening and the creation of crystalline imperfections in thin Pd films. This is essential for the growth of thin metallic epitaxial buffer layers. The microstructure of the films was analyzed by reflection high-energy electron diffraction, scanning electron microscopy, x-ray diffraction, and transmission electron microscopy. © 2001 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:89 ,  Issue: 5 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.