Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the ordered structures in lattice-mismatched InxGa1-xAs/InyAl1-yAs multiple quantum wells (MQWs). The SADP showed two sets of extra spots with asymmetrical intensity, and the high-resolution TEM image showed doublet periodicity in the contrast of the (001) lattice planes. The results of the SADP and the TEM measurements showed that a CuAu–I-type ordered structure was observed near the lattice-mismatched InxGa1-xAs/InyAl1-yAs heterointerfaces. This CuAu–I-type ordered structure had an antiphase boundary in the periodically regular InxGa1-xAs/InyAl1-yAs lattice-mismatched region. The existence of a CuAu–I-type ordered structure in InxGa1-xAs/InyAl1-yAs MQWs might originate from the lattice mismatch between the InxGa1-xAs and the InyAl1-yAs layers. These results provide important information on the microstructural properties for improving operating efficiencies in long-wavelength optoelectronic devices, such as strain compensated electroabsorption modulators utilizing lattice-mismatched InxGa1-xAs/InyAl1-yAs MQWs. © 2001 American Institute of Physics.
Published in:
Journal of Applied Physics
(Volume:89
,
Issue:
4
)
Date of Publication:
Feb 2001
- Page(s):
-
2503
-
2505
- ISSN :
-
0021-8979
- Digital Object Identifier :
-
10.1063/1.1337917
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Feb 2001