Close category search window
 

Systematic study of the normal and pumped state of high efficiency diamond particle detectors grown by chemical vapor deposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Marinelli, M. ; INFM-Dipartimento di Scienze e Tecnologie Fisiche ed Energetiche, Università di Roma “Tor Vergata,” Via di Tor Vergata, I-00133 Roma, Italy ; Milani, E. ; Paoletti, A. ; Tucciarone, A.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1332805 

The efficiency and charge collection distance (CCD) of nuclear particle detectors based on high quality diamond films grown by chemical vapor deposition (CVD) have been systematically studied as a function of the methane content in the growth gas mixture and for varying film thickness. The effects of preirradiation with β particles (pumping) have been thoroughly studied. The results fully support a recently proposed model [Marinelli etal, Appl. Phys. Lett. 75, 3216 (1999)] discussing the role of in-grain defects and grain boundaries in determining the charge collection spectra of CVD diamond films both in the normal and in the pumped state. The model allows us to quantitatively explain the dependence of CCD and efficiency on film thickness, giving a microscopic picture of the effects of preirradiation with ionizing radiation in CVD diamond films. The highest average CCD obtained is 145 μm in a 160 μm thick detector (corresponding to about 50% average efficiency), while the maximum value (about 70% efficiency) is close to 370 μm. In addition, CCD is shown to be higher than film thickness and to monotonically increase with thickness, indicating margins for further improvements. © 2001 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:89 ,  Issue: 2 )

Date of Publication: Jan 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.