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Micromagnetic simulation in two antiferromagnetically coupled ferromagnetic layers separated by a spacer

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5 Author(s)
Wang, Y.J. ; Data Storage Institute, DSI Building, 5 Engineering Drive 1, Singapore 117608 ; Wang, J.P. ; Hee, C.H. ; Chong, T.C.
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On the basis of a micromagnetic model, magnetization reversal in two antiferromagnetically coupled ferromagnetic layers (10 nm t1/0.9 nmM/t2nm films with t2=2, 3, 4, 5 nm, here t1 and t2 are the top and bottom layers, respectively, and M the spacer) with the same random anisotropy arrangement can be represented by a computer simulation. The calculation indicates that the appearance of a full antiferromagnetic coupling at remanence requires the antiferromagnetic coupling constant j=-3.5 erg/cm2 for the 10 nm t1/0.9 nmM/3 nm t2, films and it needs a large j value if t2 increases for the case of Ku2=Ku1=1×106erg/cm3 and Ms1=Ms2=400 emu/cm3. Hc follows the equation Hc=-0.755j/Mst1 (j≪0). Why the calculated Hc values deviate from Hcmax=-j/Mst1 is discussed. © 2001 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:89 ,  Issue: 11 )