Cart (Loading....) | Create Account
Close category search window

Absorption analysis of a single microparticle by optical force measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Matsuo, Yasutaka ; Research Institute for Electronic Science, Hokkaido University, Sapporo 060-0812, Japan ; Takasaki, Hidehisa ; Hotta, Jun-ichi ; Sasaki, K.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A method is proposed for precisely and instantaneously analyzing the optical absorption of a single microparticle. This method is based on the measurement of radiation pressure exerted on a particle, in which the Brownian motion of the particle is observed via total internal reflection microscopy, and then the femto-Newton-order radiation pressure induced by absorption is determined by thermodynamic analysis. On the basis of the Mie–Debye scattering theory, the imaginary part of the refractive index is estimated from the strength of the force using knowledge of the real part and the diameter of the particle. As a preliminary experiment, the concentration of rhodamine B molecules in a poly(methylmethacrylate) particle was estimated. © 2001 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:89 ,  Issue: 10 )

Date of Publication:

May 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.